On the repair of redundant RAMs
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Large-area fault clusters and fault tolerance in VLSI circuits
IBM Journal of Research and Development
Increased Throughput for the Testing and Repair of RAMs with Redundancy
IEEE Transactions on Computers
Some Prospects for Efficient Fixed Parameter Algorithms
SOFSEM '98 Proceedings of the 25th Conference on Current Trends in Theory and Practice of Informatics: Theory and Practice of Informatics
On Constrained Minimum Vertex Covers of Bipartite Graphs: Improved Algorithms
WG '01 Proceedings of the 27th International Workshop on Graph-Theoretic Concepts in Computer Science
Constrained minimum vertex cover in bipartite graphs: complexity and parameterized algorithms
Journal of Computer and System Sciences - Special issue on Parameterized computation and complexity
Balanced dual-stage repair for dependable embedded memory cores
Journal of Systems Architecture: the EUROMICRO Journal - Special issue: Desing and test of systems on a chip
TAMC'07 Proceedings of the 4th international conference on Theory and applications of models of computation
An exact algorithm based on chain implication for the Min-CVCB problem
COCOA'07 Proceedings of the 1st international conference on Combinatorial optimization and applications
Constraint bipartite vertex cover: simpler exact algorithms and implementations
Journal of Combinatorial Optimization
| Hi-index | 14.98 |
In this paper, we present a new class of linear time heuristic algorithms for reconfiguring RRAMs. One novel feature of our algorithms is that we are able to derive new bounds on the fault counts for fast detection of reparable and irreparable RRAMs. Another novel feature is that, based on our algorithms, we are able to identify a new polynomial time solvable instance of the reconfiguration problem. Empirical results indicate that our new class of algorithms is indeed fast and effective.