Efficient spare allocation in reconfigurable arrays
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Functional Testing of Semiconductor Random Access Memories
ACM Computing Surveys (CSUR)
Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
Graph Theory With Applications
Graph Theory With Applications
A New Class Of Efficient Algorithms For Reconfiguration Of Memory Arrays
IEEE Transactions on Computers
COCOON '02 Proceedings of the 8th Annual International Conference on Computing and Combinatorics
Built in self repair for embedded high density SRAM
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Family of Self-Repair SRAM Cores
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
Constraint Bipartite Vertex Cover Simpler Exact Algorithms and Implementations
FAW '08 Proceedings of the 2nd annual international workshop on Frontiers in Algorithmics
Constraint bipartite vertex cover: simpler exact algorithms and implementations
Journal of Combinatorial Optimization
| Hi-index | 14.98 |
The problem of determining whether a redundant random-access memory (RRAM) containing faulty memory cells can be repaired with spare rows and columns is discussed. The approach is to increase the number of working RRAMs manufactured per unit time, rather than per wafer, by presenting a computationally efficient algorithm for detecting unrepairability, a computationally efficient algorithm for optimal repair for special patterns of faulty memory cells and online algorithms that can find an optimal repair or else detect unrepairability during memory testing, aborting unnecessary testing. Experimental validation of the approach is given that is based on industrial device fabrication data.