M-cluster and X-ray: Two methods for multi-jammer localization in wireless sensor networks

  • Authors:
  • Tianzhen Cheng;Ping Li;Sencun Zhu;Don Torrieri

  • Affiliations:
  • School of Mechatronical Engineering, Beijing Institute of Technology, Beijing, China;School of Mechatronical Engineering, Beijing Institute of Technology, Beijing, China;Department of Computer Science and Engineering, Pennsylvania State University, University Park, PA, USA;US Army Research Laboratory, Adelphi, MD, USA

  • Venue:
  • Integrated Computer-Aided Engineering
  • Year:
  • 2014

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Abstract

Jamming is one of the most severe attacks in wireless sensor networks WSNs. While existing countermeasures mainly focus on designing new communication mechanisms to survive under jamming, a proactive solution is to first localize the jammers and then take necessary actions. Unlike the existing work that focuses on localizing a single jammer in WSNs, this work solves a multi-jammer localization problem, where multiple jammers launch collaborative attacks. We develop two multi-jammer localization algorithms: a multi-cluster localization M-cluster algorithm and an X-rayed jammed-area localization X-ray algorithm. Our extensive simulation results demonstrate that with one run of the algorithms, both M-cluster and X-ray are efficient in localizing multiple jammers in a wireless sensor network with small errors.