Automatic defect classification for semiconductor manufacturing

Recognition of semiconductor defect patterns using spatial filtering and spectral clustering

Expert Systems with Applications: An International Journal

Independent component analysis-based defect detection in patterned liquid crystal display surfaces

Image and Vision Computing

Separation of composite defect patterns on wafer bin map using support vector clustering

Expert Systems with Applications: An International Journal

PCB inspection for missing or misaligned components using background subtraction

WSEAS Transactions on Information Science and Applications

Novelty detection for the inspection of light-emitting diodes

Expert Systems with Applications: An International Journal

Automatic classification using decision tree and support vector machine

KES'05 Proceedings of the 9th international conference on Knowledge-Based Intelligent Information and Engineering Systems - Volume Part II

Machine vision based automatic separation of touching convex shaped objects

Computers in Industry

Detection and classification of defect patterns in optical inspection using support vector machines

ICIC'13 Proceedings of the 9th international conference on Intelligent Computing Theories