Boolean matching for full-custom ECL gates

Authors:
Robert N. Mayo;Hervé Touati
Affiliations:
Western Research Laboratory, Digital Equipment Corporation, Palo Alto, CA;Paris Research Laboratory, Digital Equipment Corporation, Rueil-Malmaison, France
Venue:
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Year:
1993

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