Reduced Latch Count Shift Registers

Authors:
Jacob Savir
Affiliations:
Ece Dept., New Jersey Institute of Technology, University Heights, Newark, New Jersey 07102-1982. E-mail: savir@admin.njit.edu
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1997

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Abstract

This paper shows a new family of shift register designs which enjoysa reduced latch count. Reduction in the latch count is achieved byintroducing additional clocks. The reduction in latch count may reach theultimate savings of 50%.