Residual test coverage monitoring

  • Authors:
  • Christina Pavlopoulou;Michal Young

  • Affiliations:
  • Purdue University, Electrical and Computer Engineering, West Lafayette, Indiana;University of Oregon, Computer Science Department, Eugene, Oregon

  • Venue:
  • Proceedings of the 21st international conference on Software engineering
  • Year:
  • 1999

Quantified Score

Hi-index 0.00

Visualization

Abstract