Noise estimation due to signal activity for capacitively coupled CMOS logic gates

  • Authors:
  • Kevin T. Tang;Eby G. Friedman

  • Affiliations:
  • Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York;Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York

  • Venue:
  • GLSVLSI '00 Proceedings of the 10th Great Lakes symposium on VLSI
  • Year:
  • 2000

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Abstract

The effect of interconnect coupling capacitance on neighboring CMOS logic gates driving coupled interconnections strongly depends upon the signal activity. A transient analysis of two capacitively coupled CMOS logic gates is presented in this paper for different combinations of signal activity. The uncertainty of the effective load capacitance and propagation delay due to the signal activity is addressed. Analytical expressions characterizing the output voltage and propagation delay are also presented for different signal activity conditions. The propagation delay based on these analytical expressions is within 3% as compared to SPICE, while the estimated delay neglecting the difference between the load capacitances can exceed 45%. The logic gates should be properly sized to balance the load capacitances in order to minimize any uncertainty in the signal delay. The peak noise voltage on a quiet interconnection determined from the analytical expressions is within 4% of SPICE.