Interconnect coupling noise in CMOS VLSI circuits

  • Authors:
  • Kevin T. Tang;Eby G. Friedman

  • Affiliations:
  • Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York;Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York

  • Venue:
  • ISPD '99 Proceedings of the 1999 international symposium on Physical design
  • Year:
  • 1999

Quantified Score

Hi-index 0.01

Visualization

Abstract