Independent component analysis, a new concept?
Signal Processing - Special issue on higher order statistics
Noise in deep submicron digital design
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Interconnect coupling noise in CMOS VLSI circuits
ISPD '99 Proceedings of the 1999 international symposium on Physical design
New approximations of differential entropy for independent component analysis and projection pursuit
NIPS '97 Proceedings of the 1997 conference on Advances in neural information processing systems 10
Independent component analysis: algorithms and applications
Neural Networks
Noise propagation and failure criteria for VLSI designs
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Interconnect and noise immunity design for the Pentium 4 processor
Proceedings of the 40th annual Design Automation Conference
Analysis and Reduction of Capacitive Coupling Noise in High-Speed VLSI Circuits
ICCD '01 Proceedings of the International Conference on Computer Design: VLSI in Computers & Processors
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Proceedings of the 41st annual Design Automation Conference
Realistic scalability of noise in dynamic circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Harmony: static noise analysis of deep submicron digital integrated circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Noise considerations in circuit optimization
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fast and robust fixed-point algorithms for independent component analysis
IEEE Transactions on Neural Networks
A soft computing method for detecting lifetime building thermal insulation failures
Integrated Computer-Aided Engineering
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Most of the existing noise analysis techniques in analog integrated circuits apply to only single noise source, and cannot take into account the evolving reality of multiple noise sources interacting with each other. Again the individual and relative impacts of various noise sources will determine what types of remedial steps can be taken. This paper proposes the concept of analyzing the impacts of multiple concurrent noise sources in a circuit network, and applies blind source separation (BSS) technique to analyze the characteristics of this compound noise effect in analog integrated circuits. The proposed algorithm can effectively extracts the time characteristics of individual noise sources from observed noises at circuit nodes. The estimated noise sources can aid in timing and spectral analysis and yield better design techniques.