Realistic scalability of noise in dynamic circuits

  • Authors:
  • Masud H. Chowdhury;Yehea I. Ismail

  • Affiliations:
  • Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, IL;Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, IL

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Year:
  • 2006

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Abstract

The usage of noise-sensitive dynamic circuits has become commonplace due to speed and area requirements, making the noise issue even more prominent. This paper focuses on the trends of coupling and its effects on dynamic circuits. It presents closed form analytical solutions for noise, as well as noise tolerance metrics for dynamic circuits. These solutions are within 5% of dynamic simulations. It is shown that not all scaling trends are negative for noise, and that the scaling down of supply voltage and increasing frequency, help improve certain aspects of the noise immunity of dynamic circuits. Most of the works treated the noise immunity and the noise content separately. This paper introduces an analysis of noise scalability by looking at the noise immunity and the noise content simultaneously.