Automatic control systems (6th ed.)
Automatic control systems (6th ed.)
Noise in deep submicron digital design
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
PRIMA: passive reduced-order interconnect macromodeling algorithm
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Design methodologies for noise in digital integrated circuits
DAC '98 Proceedings of the 35th annual Design Automation Conference
ClariNet: a noise analysis tool for deep submicron design
Proceedings of the 37th Annual Design Automation Conference
Towards true crosstalk noise analysis
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Driver modeling and alignment for worst-case delay noise
Proceedings of the 38th annual Design Automation Conference
A twisted-bundle layout structure for minimizing inductive coupling noise
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
False-noise analysis using logic implications
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
False-Noise Analysis using Resolution Method
ISQED '02 Proceedings of the 3rd International Symposium on Quality Electronic Design
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Static noise analysis with noise windows
Proceedings of the 40th annual Design Automation Conference
Noise characterization of static CMOS gates
Proceedings of the 41st annual Design Automation Conference
Modeling the Non-Linear Behavior of Library Cells for an Accurate Static Noise Analysis
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Noise Library Characterization for Large Capacity Static Noise Analysis Tools
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
A Comprehensive Methodology for Noise Characterization of ASIC Cell Libraries
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
A complete methodology for an accurate static noise analysis
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Proceedings of the 42nd annual Design Automation Conference
Analytical modeling of crosstalk noise waveforms using Weibull function
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
A robust cell-level crosstalk delay change analysis
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Crosstalk analysis using reconvergence correlation
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
TBNM - Transistor-Level Boundary Model for Fast Gate-Level Noise Analysis of Macro Blocks
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Fast Sequential Cell Noise Immunity Characterization Using Meta-stable Point of Feedback Loop
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Noise margin analysis for dynamic logic circuits
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Noise separation in analog integrated circuits using independent component analysis technique
Integrated Computer-Aided Engineering
Compound noise separation in digital circuits using blind source separation
Microelectronics Journal
Probabilistic analysis and design of metallic-carbon-nanotube-tolerant digital logic circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Built-in sensor for signal integrity faults in digital interconnect signals
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement
Proceedings of the 47th Design Automation Conference
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 0.00 |
Noise analysis has become a critical concern in advanced chip designs. Traditional methods suffer from two common issues. First, noise that is propagated through the driver of a net is combined with noise injected by capacitively coupled aggressor nets using linear summation. Since this ignores the non-linear behavior of the driver gate the noise that develops on a net can be significantly underestimated. We therefore propose a new linear model that accurately combines propagated and injected noise on a net and which maintains the efficiency of linear simulation. After the propagated and injected noise are correctly combined on a victim net, it is necessary to determine if the noise can result in a functional failure. This is the second issue that we discuss in this paper. Traditionally, noise failure criteria have been based on unity gain points of the DC or AC transfer curves. However, we will show that for digital designs, these approaches can result in a pessimistic analysis in some cases, while in other cases, they allow circuit operation that is extremely close to regions that are unstable and do not allow sufficient margin for error in the analysis. In this paper, we compare the effectiveness of the discussed noise failure criteria and also present a propagation based method, which is intended to overcome these drawbacks. The proposed methods were implemented in a noise analysis tool and we demonstrate results on industrial circuits.