ClariNet: a noise analysis tool for deep submicron design

  • Authors:
  • Rafi Levy;David Blaauw;Gabi Braca;Aurobindo Dasgupta;Amir Grinshpon;Chanlee Oh;Boaz Orshav;Supamas Sirichotiyakul;Vladimir Zolotov

  • Affiliations:
  • Motorola Semiconductor Israel Ltd. Tel Aviv, Israel;Motorola Inc. Austin, TX;Motorola Semiconductor Israel Ltd. Tel Aviv, Israel;Motorola Inc. Austin, TX;Motorola Semiconductor Israel Ltd. Tel Aviv, Israel;Motorola Inc. Austin, TX;Motorola Inc. Austin, TX;Motorola Inc. Austin, TX;Motorola Inc. Austin, TX

  • Venue:
  • Proceedings of the 37th Annual Design Automation Conference
  • Year:
  • 2000

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Abstract

Coupled noise analysis has become a critical issue for deep-submicron, high performance design. In this paper, we present, ClariNet, an industrial noise analysis tool, which was developed to efficiently analyze large, high performance processor designs. We present the overall approach and tool flow of ClariNet and discuss three critical large-processor design issues which have received limited discussion in the past. First, we present how the driver gates of a coupled interconnect network are represented with accurate linear models. Second, we show how to speed the analysis of large designs by using noise filters based on reduced interconnect representations and then pruning the nets coupled to a signal net. Third, we show how to incorporate logic and timing correlations into noise analysis to reduce its pessimism. We present the results from several industrial circuits, including a large high performance microprocessor design and a DSP design.