New ideas for solving covering problems
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
ClariNet: a noise analysis tool for deep submicron design
Proceedings of the 37th Annual Design Automation Conference
Improved Approach for Noise Propagation to Identify Functional Noise Violations
VLSID '04 Proceedings of the 17th International Conference on VLSI Design
Weibull Based Analytical Waveform Model
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Noise Library Characterization for Large Capacity Static Noise Analysis Tools
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Analytical modeling of crosstalk noise waveforms using Weibull function
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Harmony: static noise analysis of deep submicron digital integrated circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Crosstalk analysis has become an essential part of high performance design in nanometer technologies. Interconnects in nanometer technology have increased resistance and coupling capacitance due to process scaling. The crosstalk pulses are complex and require a new modeling approach. We show that current models such as triangular and Weibull exhibit as much as 31% error in propagated pulse for some crosstalk waves in nanometer technology. We present a methodology based on wave fitting as a model for crosstalk waves. We compare the accuracy of the wave fitting model proposed with existing wave models such as: Weibull, isosceles triangular and trapezoidal. We present the simulation results for different gates in 65nm Bulk CMOS technology and provide a comparison in error statistics for propagated crosstalk pulse. We demonstrate that our approach has a average propagated pulse error of less than 5% and improves the overall crosstalk analysis results by at least 67%.