Independent component analysis, a new concept?
Signal Processing - Special issue on higher order statistics
Noise in deep submicron digital design
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
New approximations of differential entropy for independent component analysis and projection pursuit
NIPS '97 Proceedings of the 1997 conference on Advances in neural information processing systems 10
Independent component analysis: algorithms and applications
Neural Networks
Noise propagation and failure criteria for VLSI designs
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Interconnect and noise immunity design for the Pentium 4 processor
Proceedings of the 40th annual Design Automation Conference
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Proceedings of the 41st annual Design Automation Conference
Fast and robust fixed-point algorithms for independent component analysis
IEEE Transactions on Neural Networks
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Analysis of individual noise sources in pre-nanometer circuits cannot take into account the evolving reality of multiple noise sources interacting with each other. Noise measurement made at an evaluation node will reflect the cumulative effect of all the active noise sources, while individual and relative severity of various noise sources will determine what types of remedial steps can be taken, pressing the need for development of algorithms that can analyze the contributions of different noise sources when a noise measurement is available. This paper addresses the cocktail-party problem inside integrated circuits with multiple noise sources. It presents a method to extract the time characteristics of individual noise source from the measured compound voltage in order to study the contribution and properties of each source. This extraction is facilitated by application of blind source separation technique, which is based on the assumption of statistical independence of various noise sources over time. The estimated noise sources can aid in performing timing and spectral analysis, and yield better circuit design techniques.