Combinatorial optimization: algorithms and complexity
Combinatorial optimization: algorithms and complexity
Integer and combinatorial optimization
Integer and combinatorial optimization
A protocol test generation procedure
Computer Networks and ISDN Systems
Discrete optimization
Formal Methods for Protocol Testing: A Detailed Study
IEEE Transactions on Software Engineering
Trace Analysis for Conformance and Arbitration Testing
IEEE Transactions on Software Engineering
Graphs: theory and algorithms
Formal methods for test sequence generation
Computer Communications
IWPTS '94 7th IFIP WG 6.1 international workshop on Protocol test systems
A new technique for generating protocol test
SIGCOMM '85 Proceedings of the ninth symposium on Data communications
On the complexity of edge traversing
Journal of the ACM (JACM)
Approaches utilizing segment overlap to minimize test sequences
Proceedings of the IFIP WG6.1 Tenth International Symposium on Protocol Specification, Testing and Verification X
The first ten years, the next ten years
Proceedings of the IFIP WG6.1 Tenth International Symposium on Protocol Specification, Testing and Verification X
Applications of Sufficient Conditions for Efficient Protocol Test Generation
Proceedings of the IFIP TC6/WG6.1 Fifth International Workshop on Protocol Test Systems V
A Further Optimization Technique for Conformance Testing Based on Multiple UIO Sequences
Proceedings of the IFIP TC6/WG6.1 Fifth International Workshop on Protocol Test Systems V
Fault Coverage of UIO-based Methods for Protocol Testing
Proceedings of the IFIP TC6/WG6.1 Sixth International Workshop on Protocol Test systems VI
| Hi-index | 15.00 |
The minimum length test sequence generation method proposed in [2] for conformance testing of a protocol uses Unique Input Sequences (UIS) for state identification. This method, called the U-method, requires that the test graph, a graph derived from the protocol, be connected. This requirement also needs to be satisfied in the case of the MU-method [31], [30], which assumes that the multiple UISs are available for each state. Thus, the U-method and the MU-method may not provide minimum length test sequences in cases where the test graph is not connected. Nevertheless, these methods generate minimum length test sequences with high fault coverage whenever the test graph is connected. This raises an important problem: Does there exist an assignment of UISs to the transitions such that the resulting test graph is connected? In this paper, we formulate this problem as a maximum cardinality two matroid intersection problem and discuss an efficient algorithmic solution. We also point out the role of the work in the minimum length test sequence generation problem.