Review: Fault detection and diagnosis capabilities of test sequence selection methods based on the FSM model

Authors:
T Ramalingam;Anindya Das;K Thulasiraman
Affiliations:
Department of Electrical and Computer Engineering, Concordia University, Montreal, Canada;DIRO, University of Montreal, Montreal, Canada;Department of Electrical and Computer Engineering, Concordia University, Montreal, Canada
Venue:
Computer Communications
Year:
1995

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Abstract

Different test sequence selection methods, namely, the D-method, C-method, W-method, T-method, U-method, Uv-method and the Wp-method, are reviewed and analysed for their fault detection capabilities. We show that the C-method and the Uv-method do not provide complete fault coverage. These seven methods are formally analysed for their fault diagnosis capabilities under single fault assumption. Among these methods the W-method and the Wp-method provide the best resolution in diagnosing the fault. The test sequence selection methods are then compared based on the length of the test sequences they select, and their fault detection and diagnosis capabilities.