Hot carrier degradation and time-dependent dielectric breakdown in oxides

• Authors:

• G. Groeseneken;R. Degraeve;T. Nigam;G. Van den Bosch;H. E. Maes

• Affiliations:

• -;-;-;-;-

• Venue:
• Proceedings of the third session on Reliability in VLSI circuits : operation, manufacturing and design: operation, manufacturing and design
• Year:
• 1999