Fault diameter of interconnection networks

  • Authors:
  • M. S. Krishnamoorthy;b. Krishnamurthy

  • Affiliations:
  • Rensselaer Polytechnic Institute, Troy, NY;Tektronix Inc., Beaverton, OR

  • Venue:
  • Computers and Mathematics with Applications - Diagnosis and reliable design of VLSI systems
  • Year:
  • 1987

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Abstract