A protocol test generation procedure
Computer Networks and ISDN Systems
An algorithm to reduce test application time in full scan designs
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Static Test Compaction for Scan-Based Designs to Reduce Test Application Time
ATS '98 Proceedings of the 7th Asian Test Symposium
Test application time reduction for sequential circuits with scan
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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