Crosstalk noise in future digital CMOS circuits

Authors:
C. Werner;R. Göttsche;A. Wörner;U. Ramacher
Affiliations:
Infineon Technologies, Corporate Research, Munich;Infineon Technologies, Corporate Research, Munich;Infineon Technologies, Corporate Research, Munich;Infineon Technologies, Corporate Research, Munich
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2001

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Abstract