A deductive technique for diagnosis of bridging faults
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Crosstalk noise in future digital CMOS circuits
Proceedings of the conference on Design, automation and test in Europe
Clock controller design in SuperSPARC II microprocessor
ICCD '95 Proceedings of the 1995 International Conference on Computer Design: VLSI in Computers and Processors
Structured Design-for-Debug - The SuperSPARCTM II Methodology and Implementation
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Pentium® Pro Processor Design for Test and Debug
Proceedings of the IEEE International Test Conference
Comparing Functional and Structural Tests
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Evaluating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits
ITC '02 Proceedings of the 2002 IEEE International Test Conference
A reconfigurable design-for-debug infrastructure for SoCs
Proceedings of the 43rd annual Design Automation Conference
Expanding Trace Buffer Observation Window for In-System Silicon Debug through Selective Capture
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
ATS '10 Proceedings of the 2010 19th IEEE Asian Test Symposium
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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A common scenario in industry today is "No Trouble Found" (NTF) due to functional failures. A component on a board fails during board-level functional test, but it passes the Automatic Test Equipment (ATE) test when it is returned to the supplier for warranty replacement or service repair. To find the root cause of NTF, we propose an innovative functional test approach and DFT methods for the detection of boardlevel functional failures. These DFT and test methods allow us to reproduce and detect functional failures in a controlled deterministic environment, which can provide ATE tests to the supplier for early screening of defective parts. Experiments on an industry design show that functional scan test with appropriate functional constraints can adequately mimic the functional state space well (measured by appropriate coverage metrics). Experiments also show that most functional failures due to stuck-at, dominant bridging, and crosstalk faults can be reproduced and detected by functional scan test.