Prediction of interconnect fan-out distribution using Rent's rule
SLIP '00 Proceedings of the 2000 international workshop on System-level interconnect prediction
Managing interconnect resources (tutorial)
SLIP '00 Proceedings of the 2000 international workshop on System-level interconnect prediction
Can recursive bisection alone produce routable placements?
Proceedings of the 37th Annual Design Automation Conference
On the Characterization of Multi-Point Nets in Electronic Designs
GLS '98 Proceedings of the Great Lakes Symposium on VLSI '98
A benchmark diagnostic model generation system
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans - Special issue on model-based diagnostics
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Power-law scaling phenomena that govern VLSI circuits have for several decades formed the foundation of VLSI interconnect estimation. This research investigates possible alternative power-law phenomena in VLSI circuits. In particular, we develop newrandom growthmodels and assess their implications for VLSI interconnect structure. We assess our models' predictions forfanout,crossing edge, andterminalscaling using test data from 21 industry standard-cell designs with up to 283K cells. Our work demonstrates the possibility of non-Rent based, yet equally plausible and well-fitting, structural models for VLSI circuits and their interconnections.