Towards synthetic benchmark circuits for evaluating timing-driven CAD tools
ISPD '99 Proceedings of the 1999 international symposium on Physical design
Prediction of interconnect fan-out distribution using Rent's rule
SLIP '00 Proceedings of the 2000 international workshop on System-level interconnect prediction
High-level power estimation with interconnect effects
ISLPED '00 Proceedings of the 2000 international symposium on Low power electronics and design
Interconnect implications of growth-based structural models for VLSI circuits
Proceedings of the 2001 international workshop on System-level interconnect prediction
A stochastic model for the interconnection topology of digital circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - System Level Design
Estimation of wirelength reduction for λ-geometry vs. manhattan placement and routing
Proceedings of the 2003 international workshop on System-level interconnect prediction
A priori wire length distribution models with multiterminal nets
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on system-level interconnect prediction (SLIP)
Prediction of interconnect adjacency distribution: derivation, validation, and applications
Proceedings of the 2004 international workshop on System level interconnect prediction
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Important layout properties of electronic designs include interconnection length values, clock speed, area requirements, and power dissipation. A reliable estimation of those properties is essential for improving placement and routing techniques for digital circuits.Previous work on estimating design properties failed to take multi-point nets into account. All nets were assumed to be 2-point nets (especially for estimating the number of nets). In this paper, we aim at characterizing multi-point nets in electronic designs. We will develop a model for the behaviour of multi-point nets during the partitioning process. The resulting distribution of nets over their net degree will be validated through comparison with benchmark data.