High-level power estimation with interconnect effects

  • Authors:
  • Kavel M. Büyükşahin;Farid N. Najm

  • Affiliations:
  • -;-

  • Venue:
  • ISLPED '00 Proceedings of the 2000 international symposium on Low power electronics and design
  • Year:
  • 2000

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Abstract

We extend earlier work on high-level average power estimation to include the power due to interconnect loading. The resulting technique is a combination of a RTL-level gate count prediction method and average interconnect estimation based on Rent's rule. The method can be adapted to be used with different place and route engines and standard cell libraries. For a number of benchmark circuits, the method is verified by extracting wire lengths from a layout of each circuit and then comparing the predicted (at RTL) power against that measured using SPICE. An average error of 14.4% is obtained for the average interconnect length, and an average error of 25.8% is obtained for average power estimation including interconnect effects.