Pre-silicon verification of the Alpha 21364 microprocessor error handling system

Authors:
Richard Lee;Benjamin Tsien
Affiliations:
Compaq Computer Corporation, 181 Lytton Avenue, Palo Alto, CA;Compaq Computer Corporation, 181 Lytton Avenue, Palo Alto, CA
Venue:
Proceedings of the 38th annual Design Automation Conference
Year:
2001

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Abstract

This paper presents the strategy used to verify the error logic in the Alpha 21364 microprocessor. Traditional pre-silicon strategies of focused testing or unit-level random testing yield limited results in finding complex bugs in the error handling logic of a microprocessor. This paper introduces a technique to simulate error conditions and their recovery in a global environment using random test stimulus closely approximating traffic found in a real system. A significant number of bugs were found using this technique. A majority of these bugs could not be uncovered using a simple random environment, or were counter-intuitive to focused test design.