A geometric approach to subpixel registration accuracy

  • Authors:
  • Carlos A. Berenstein;Laveen N. Kanal;David Lavine;Eric C. Olson

  • Affiliations:
  • L. N. K. Corporation, Riverdale, MD;L. N. K. Corporation, Riverdale, MD;L. N. K. Corporation, Riverdale, MD;L. N. K. Corporation, Riverdale, MD

  • Venue:
  • Computer Vision, Graphics, and Image Processing
  • Year:
  • 1987

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Abstract