IEEE Transactions on Pattern Analysis and Machine Intelligence
A geometric approach to subpixel registration accuracy
Computer Vision, Graphics, and Image Processing
Localization and Noise in Edge Detection
IEEE Transactions on Pattern Analysis and Machine Intelligence
Subpixel Measurements Using a Moment-Based Edge Operator
IEEE Transactions on Pattern Analysis and Machine Intelligence
Predicting and Estimating the Accuracy of a Subpixel Registration Algorithm
IEEE Transactions on Pattern Analysis and Machine Intelligence
Subpixel Edge Location in Binary Images Using Dithering
Subpixel Edge Location in Binary Images Using Dithering
Machine vision system for inspecting electric plates
Computers in Industry
Sub-pixel subdivision research on linear CCD screen images
CGIM '08 Proceedings of the Tenth IASTED International Conference on Computer Graphics and Imaging
Depth reconstruction uncertainty analysis and improvement - The dithering approach
Image and Vision Computing
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This paper concerns the problem of obtaining subpixel estimates of the locations of straight edges in binary digital images using dithering. By adding uniformly distributed independent random noise it is shown that estimation bias may be removed and that the estimation variance is inversely proportional to the length of the line segment. The sensitivity to incorrect dither amplitude is calculated, and implementation is discussed.