Detection of Intensity Changes with Subpixel Accuracy Using Laplacian-Gaussian Masks
IEEE Transactions on Pattern Analysis and Machine Intelligence
Precision Edge Contrast and Orientation Estimation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Digital image processing
An Operator Which Locates Edges in Digitized Pictures
Journal of the ACM (JACM)
A Local Visual Operator Which Recognizes Edges and Lines
Journal of the ACM (JACM)
Erratum: `` A Local Visual Operator Which Recognizes Edges and Lines''
Journal of the ACM (JACM)
On Achievable Accuracy in Edge Localization
IEEE Transactions on Pattern Analysis and Machine Intelligence
On the Edge Location Error for Local Maximum and Zero-Crossing Edge Detectors
IEEE Transactions on Pattern Analysis and Machine Intelligence
IEEE Transactions on Pattern Analysis and Machine Intelligence
Machine vision system for inspecting electric plates
Computers in Industry
Modeling Edges at Subpixel Accuracy Using the Local Energy Approach
IEEE Transactions on Pattern Analysis and Machine Intelligence
Subpixel Edge Location in Binary Images Using Dithering
IEEE Transactions on Pattern Analysis and Machine Intelligence
Representing Edge Models via Local Principal Component Analysis
ECCV '02 Proceedings of the 7th European Conference on Computer Vision-Part I
Errors in the estimation of gradient direction using IIR and FIR implementations
ICIP '95 Proceedings of the 1995 International Conference on Image Processing (Vol.2)-Volume 2 - Volume 2
Probability distribution of sub-pixel edge position
Signal Processing
Edge detection based on modified BP algorithm of ANN
VIP '05 Proceedings of the Pan-Sydney area workshop on Visual information processing
Custom-Built Moments for Edge Location
IEEE Transactions on Pattern Analysis and Machine Intelligence
Subpixel edge location based on orthogonal Fourier-Mellin moments
Image and Vision Computing
Non-linear fourth-order image interpolation for subpixel edge detection and localization
Image and Vision Computing
3D curve structure reconstruction from a sparse set of unordered images
Computers in Industry
International Journal of Remote Sensing
High-accuracy edge detection with Blurred Edge Model
Image and Vision Computing
Smooth adaptation by sigmoid shrinkage
Journal on Image and Video Processing
Sub-pixel edge fitting using B-spline
MIRAGE'07 Proceedings of the 3rd international conference on Computer vision/computer graphics collaboration techniques
An automated vision-based inspection system for bearing gland covers
IITA'09 Proceedings of the 3rd international conference on Intelligent information technology application
Integrating local distribution information with level set for boundary extraction
Journal of Visual Communication and Image Representation
A novel sub-pixel edge detection for micro-parts manipulation
ROBIO'09 Proceedings of the 2009 international conference on Robotics and biomimetics
A new edge detection method using Gaussian-Zemike moment operator
CAR'10 Proceedings of the 2nd international Asia conference on Informatics in control, automation and robotics - Volume 1
Sub-pixel edge detection based on an improved moment
Image and Vision Computing
ICISP'10 Proceedings of the 4th international conference on Image and signal processing
Accurate subpixel edge location based on partial area effect
Image and Vision Computing
| Hi-index | 0.14 |
Recent results in precision measurements using computer vision are presented. An edge operator based on two-dimensional spatial moments is given. The operator can be implemented for virtually any size of window and has been shown to locate edges in digitized images to a twentieth of a pixel. This accuracy is unaffected by additive or multiplicative changes to the data values. The precision is achieved by correcting for many of the deterministic errors caused by nonideal edge profiles using a lookup table to correct the original estimates of edge orientation and location. This table is generated using a synthesized edge which is located at various subpixel locations and various orientations. The operator is extended to accommodate nonideal edge profiles and rectangularly sampled pixels. The technique is applied to the measurement of imaged machined metal parts. Theoretical and experimental noise analyses show that the operator has relatively small bias in the presence of noise.