Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Delay Fault Coverage Enhancement Using Variable Observation Times

Journal of Electronic Testing: Theory and Applications

Confidence analysis for defect-level estimation of VLSI random testing

ACM Transactions on Design Automation of Electronic Systems (TODAES)

On theoretical and practical considerations of path selection for delay fault testing

Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design

Assessing the Quality Level of Digital CMOS IC's under the Hypothesis of Non-Uniform Distribution of Fault Probabilities

EDTC '96 Proceedings of the 1996 European conference on Design and Test

Delay Fault Coverage Enhancement Using Multiple Test Observation Times

VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications

Should Yield be a Design Objective?

ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design