Modulo 3 Residue Checker: New Results on Performance and Cost

  • Authors:
  • James W. Watterson;Jill J. Hallenbeck

  • Affiliations:
  • Research Triangle Institute, Research Triangle Park, NC;Research Triangle Institute, Research Triangle Park, NC

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1988

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Abstract

The performance and cost of a modulo-3 residue code checker that has been attached to a pipelined serial multiplier to provide a concurrent self-test capability are considered. Analytical results are derived for error detection coverage and minimum error latency; these quantities are observed to be in agreement with simulation results obtained by using ISPS, a register-transfer language. The residue checker error detection coverage and minimum error latency are observed to be dependent on the statistical properties of the multiplier input operands. The checker and serial multiplier were implemented in 4- mu m NMOS, using a standard cell design. The residue code checker required approximately half of the total silicon area.