Jacob A. Abraham;Vinod K. Agarwal
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Gate-level test generation for sequential circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A New Framework for Designing: Built-in Test Multichip Modules with Pipelined Test Strategy
IEEE Design & Test
Counter-Based Compaction: Delay and Stuck-Open Faults
IEEE Transactions on Computers
References
SystemC