Simulated annealing: theory and applications
Simulated annealing: theory and applications
Simulated annealing and Boltzmann machines: a stochastic approach to combinatorial optimization and neural computing
A neural network approach to the 3-satisfiability problem
Journal of Parallel and Distributed Computing - Neural Computing
Computer
A transitive closure based algorithm for test generation
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Convergence Properties of Optimization Algorithms for the SAT Problem
IEEE Transactions on Computers
Global Optimization for Satisfiability (SAT) Problem
IEEE Transactions on Knowledge and Data Engineering
A Fault-Independent Transitive Closure Algorithm for Redundancy Identification
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
| Hi-index | 0.00 |
Two recently proposed models of digital circuits that are useful in parallel test-generation methods are described. In the neural net model, the input and output signal states of a logic gate are related through an energy function. In the Boolean satisfiability model, a logic gate is represented by a truth expression. How the equivalence of these models offers the flexibility of using the same algorithm in two different environments is shown. The models can be used in parallel methods for solving CAD problems such as simulation and test generation.