Range Sensing by Projecting Multiple Slits with Random Cuts

  • Authors:
  • M. Maruyama;S. Abe

  • Affiliations:
  • -;-

  • Venue:
  • IEEE Transactions on Pattern Analysis and Machine Intelligence
  • Year:
  • 1993

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Abstract

A method for range sensing that projects a single pattern of multiple slits is described. Random dots are used to identify each slit. The random dots are given as randomly distributed cuts on each slit. Thus, each slit is divided into many small line segments. Segment matching between the image and the pattern is performed to obtain 3-D data. Using adjacency relations among slit segments, the false matches are reduced, and segment pairs whose adjacent segments correspond with each other are extracted and considered to be correct matches. Then, from the resultant matches, the correspondence is propagated by exploiting the adjacency relationships to get an entire range image.