Alignment and Correspondence Using Singular Value Decomposition

  • Authors:
  • Bin Luo;Edwin R. Hancock

  • Affiliations:
  • -;-

  • Venue:
  • Proceedings of the Joint IAPR International Workshops on Advances in Pattern Recognition
  • Year:
  • 2000

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Abstract

This paper casts the problem of point-set alignment and correspondence into a united framework. The utility measure underpinning the work is the cross-entropy between probability distributions for alignment and assignment errors. We show how Procrustes alignment parameters and correspondence probabilities can be located using dual singular value decompositions. Experimental results using both synthetic and real images are given.