PARCOURS - Substrate Crosstalk Analysis for Complex Mixed-Signal-Circuits

Authors:
Andreas Herrmann;Erich Barke;Mathias Silvant;Jürgen Schlöffel
Affiliations:
-;-;-;-
Venue:
PATMOS '00 Proceedings of the 10th International Workshop on Integrated Circuit Design, Power and Timing Modeling, Optimization and Simulation
Year:
2000

Citing 4
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Abstract

In integrated mixed-signal circuits signal integrity is affected by parasitic substrate coupling. Therefore, substrate crosstalk analysis has to be performed in layout verification. The PARasitic COUpling Model GeneratoR for Substrate (PARCOURS) applies a three-dimensional model for the substrate considering conductivity and permittivity if required. As a remarkable feature PARCOURS uses different levels of accuracy. The highest level integrates circuit elements with multiple substrate terminals in order to model the flow of parasitic currents in the vicinity of the die surface. The lowest level simplifies the substrate terminal as a point connection. A commercial videochip has been examined with the introduced approach.