Test Generation for Stuck-at and Gate-Delay Faults in Sequential Circuits: A Mixed Functional/Structural Method

• Authors:

• Franco Fummi;Donatella Sciuto;Micaela Serra

• Affiliations:

• -;-;-

• Venue:
• Proceedings of the The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
• Year:
• 1994