Reliability Enhancement of Analog-to-Digital Converters (ADCs)

  • Authors:
  • Mandeep Singh;Israel Koren

  • Affiliations:
  • -;-

  • Venue:
  • DFT '01 Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
  • Year:
  • 2001

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Abstract