Analog BIST Generator for ADC Testing

  • Authors:
  • S. Bernard;Florence Azaïs;Yves Bertrand;Michel Renovell

  • Affiliations:
  • -;-;-;-

  • Venue:
  • DFT '01 Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
  • Year:
  • 2001

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Abstract