Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Expediting Ramp-to-Volume Production
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Correlation of Logical Failures to a Suspect Process Step
ITC '99 Proceedings of the 1999 IEEE International Test Conference
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
An ATE assisted DFD technique for volume diagnosis of scan chains
Proceedings of the 50th Annual Design Automation Conference
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