Test Vector Generation for Parametric Path Delay Faults

Authors:
Mukund Sivaraman;Andrzej J. Strojwas
Affiliations:
-;-
Venue:
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Year:
1995

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Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faults

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VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits

Journal of Electronic Testing: Theory and Applications

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Abstract