A strategy for diagnosis based on empirical and model knowledge
6th Internation Workshop Vol. 1 on Expert Systems & Their Applications
Using Program Slicing in Software Maintenance
IEEE Transactions on Software Engineering
From Hardware to Software Testability
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Diagnostic ATPG for Delay Faults Based on Genetic Algorithms
Proceedings of the IEEE International Test Conference on Test and Design Validity
IEEE Transactions on Software Engineering
From Testing to Diagnosis: An Automated Approach
Proceedings of the 19th IEEE international conference on Automated software engineering
Improving test suites for efficient fault localization
Proceedings of the 28th international conference on Software engineering
Accurate rank ordering of error candidates for efficient HDL design debugging
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper, we focus on high level design diagnosis. Anovel diagnosis strategy is presented which allows faultsto be automatically located. Given a system under test, thismethod effectively restricts the suspected parts in order tocorrect the detected faults.