A Diagnostic ATPG for Delay Faults Based on Genetic Algorithms

Towards an automatic diagnosis for high-level design validation

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Adaptive Techniques for Improving Delay Fault Diagnosis

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Fault Distinguishing Pattern Generation

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Evolutionary Optimization in Code-Based Test Compression

Proceedings of the conference on Design, Automation and Test in Europe - Volume 2

Test set enrichment using a probabilistic fault model and the theory of output deviations

Proceedings of the conference on Design, automation and test in Europe: Proceedings