Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs

Authors:
Michele Favalli;Marcello Dalpasso;Piero Olivio;Bruno Riccò
Affiliations:
-;-;-;-
Venue:
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Year:
1992

Citing 0
Cited 2

Fault characterizations and design-for-testability technique for detecting $I_{DDQ}$ faults in CMOS/BiCMOS circuits

Proceedings of the 38th annual Design Automation Conference
BiCMOS logic testing

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Quantified Score

Hi-index	0.00

Visualization

Abstract