Testable synthesis of high complex control devices
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
Design for Testability Using State Distances
Journal of Electronic Testing: Theory and Applications - Special issue on test synthesis
Synthesizing Circuits with Implicit Testability Constraints
IEEE Design & Test
A layout-based approach for ordering scan chain flip-flops
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On synthesizing circuits with implicit test ability constraints
ITC'94 Proceedings of the 1994 international conference on Test
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