Tackling test trade-offs from design, manufacturing to market using economic modeling

• Authors:

• Erik H. Volkerink;Ajay Khoche;Linda A. Kamas;Jochen Rivoir;Hans G. Kerkhoff

• Affiliations:

• -;-;-;-;-

• Venue:
• Proceedings of the IEEE International Test Conference 2001
• Year:
• 2001