Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
A Scalable On-Chip Jitter Extraction Technique
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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