IS-FPGA: A New Symmetric FPGA Architecture with Implicit SCAN
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs
Journal of Electronic Testing: Theory and Applications
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The objective of this paper is to generate an Application-Oriented Test Procedure to be used by a FPGA user in a given application. General definitions concerning the specific problem of testing RAM-based FPGAs are first given such as the important concept of 'AC-non-redundant fault." Then, it is commented that a classical test pattern generation performed on the circuit netlist gives a low AC-non-redundant fault coverage and it is pointed out that test pattern generation performed on a FPGA representation is required. It is also commented that test pattern generation performed on the FPGA representation can be significantly accelerated by different techniques. A procedure called TOF is described to validate the proposed approach on benchmark circuits.