Low-energy off-chip SDRAM memory systems for embedded applications
ACM Transactions on Embedded Computing Systems (TECS)
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Power consumption is an important parameter for a dynamic random access memory (DRAM). Measurement of power consumption via the time dependent active current gives further insight into DRAM operation. Average current measurement techniques are presented in this paper to analyze time dependent current components and to calculate bitline and interbitline capacitances from power consumption.