Rapid Gate Matching with Don't Cares

  • Authors:
  • A. -M. Trullemans;Q. Zhang

  • Affiliations:
  • UCL-Laboratoire de Microélectronique, Place du Levant, n° 3, B-1348 Louvain-la-Neuve, Belgium;UCL-Laboratoire de Microélectronique, Place du Levant, n° 3, B-1348 Louvain-la-Neuve, Belgium

  • Venue:
  • EDTC '96 Proceedings of the 1996 European conference on Design and Test
  • Year:
  • 1996

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Abstract

Ending the logic synthesis, the technology mapping step maps the Boolean function on physical cells. This itep is based on a matching check, which complexity depends on the number of library cell inputs, and increases if don't cares are considered. The method presented here is based on fault analysis. Using a structural equivalent of the cell, it allows to prune dramatically the design space, and derives at the same time the input phase. The experimental results show a real improvement in CPU time compared to ROBDD based Boolean matching, and are promising to handle complex cells.